- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 9/02055 - Reduction or prevention of errors; Testing; Calibration
Patent holdings for IPC class G01B 9/02055
Total number of patents in this class: 168
10-year publication summary
0
|
1
|
3
|
1
|
6
|
10
|
25
|
38
|
51
|
20
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
ASML Netherlands B.V. | 6816 |
10 |
Carl Zeiss SMT GmbH | 2646 |
8 |
Centre National de La Recherche Scientifique | 9632 |
5 |
Mitutoyo Corporation | 1218 |
4 |
Silixa Ltd. | 95 |
4 |
Massachusetts Institute of Technology | 9795 |
3 |
Omron Corporation | 6968 |
3 |
ams International AG | 399 |
3 |
Ecole Superieure de Physique et de Chimie Industrielles de La Ville de Paris | 292 |
3 |
LightLab Imaging, Inc. | 260 |
3 |
Tokyo Seimitsu Co., Ltd. | 257 |
3 |
NEC Corporation | 32703 |
2 |
Raytheon Company | 8535 |
2 |
California Institute of Technology | 3884 |
2 |
Compagnie générale des établissements Michelin SCA | 2477 |
2 |
ADIGE S.p.A. | 48 |
2 |
Associated Universities, Inc. | 45 |
2 |
Carl Zeiss Meditec, Inc. | 282 |
2 |
Institut National Polytechnique de Toulouse | 199 |
2 |
National Research Council of Canada | 1545 |
2 |
Other owners | 101 |